Knowledge sourcing by foreign multinationals: Patent citation analysis in the U.S. semiconductor industry
- 1 December 1996
- journal article
- research article
- Published by Wiley in Strategic Management Journal
- Vol. 17 (S2) , 155-165
- https://doi.org/10.1002/smj.4250171113
Abstract
Do multinationals go abroad to acquire technological knowledge? Do they also contribute knowledge locally? We investigate the learning and contribution patterns of multinational firms in the U.S. semiconductor industry through the analysis of citations to their patents and through field interviews. We find that the knowledge used in innovation by foreign subsidiaries in U.S. regions is predominantly local (at the regional and country level). In fact, foreign firms use regional knowledge significantly more than similar domestic firms. In the case of European and Korean firms, foreign investment is directed towards offsetting home country technological weaknesses. The study finds that foreign firms also contribute to local technological progress—a significant proportion of the citations to their patents are local. Local learning without contributing may not be possible.Keywords
Funding Information
- Reginald H. Jones Center
- Wharton School of the University of Pennsylvania
This publication has 13 references indexed in Scilit:
- Direct validation of citation counts as indicators of industrially important patentsPublished by Elsevier ,2002
- Information Costs and Location of FDIs within the Host Country: Empirical Evidence from ItalyJournal of International Business Studies, 1995
- Geographic Localization of Knowledge Spillovers as Evidenced by Patent CitationsThe Quarterly Journal of Economics, 1993
- Technological Capabilities and Japanese Foreign Direct Investment in the United StatesThe Review of Economics and Statistics, 1991
- Innovation and Learning: The Two Faces of R & DThe Economic Journal, 1989
- Research notes and communications a note on global strategiesStrategic Management Journal, 1989
- Semiconductor technology flow through formal transfer mechanismsIEEE Transactions on Engineering Management, 1989
- Patents as indicators of corporate technological strengthResearch Policy, 1987
- The hypermodern MNC—A heterarchy?Human Resource Management, 1986
- International Corporations: The Industrial Economics of Foreign InvestmentEconomica, 1971