X-Ray Diffraction Measurement of Strain in Multiphase Systems
- 1 September 1967
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (10) , 3959-3964
- https://doi.org/10.1063/1.1709047
Abstract
It is shown that failure to take into account the nonuniformity of stress in particles near a surface may lead to gross errors when stress measurements are made by x-ray diffraction on crystallites of one phase dispersed in a matrix of another phase. In particular, the measured strains may depend on the wavelength of the radiation used, and on the particle size of the dispersed phase even though the actual strains in particles not too close to the surface are not dependent on particle size. The measured strains may differ by a factor of two or three from the strains in particles below the x-ray penetration depth. Experimental evidence on a vitreous china (quartz—glass) system is presented, showing that the observed variation of strain with wavelength and particle size is of about the magnitude predicted by calculation on a simple model system.This publication has 6 references indexed in Scilit:
- Comparison of Strength of Triaxial Porcelains Containing Alumina and SilicaJournal of the American Ceramic Society, 1967
- X‐Ray Strain Measurement Techniques for Ceramic BodiesJournal of the American Ceramic Society, 1961
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- Determination of Residual Stresses in Titanium Carbide‐Base Cermets by High‐Temperature X‐Ray DiffractionJournal of the American Ceramic Society, 1958
- Nuclei of Strain in the Semi-Infinite SolidJournal of Applied Physics, 1950
- The thermal expansion of quartz by x-ray measurementsProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1933