A new UHV system with integrated STM for industrial applications
- 1 September 1989
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 22 (9) , 788-790
- https://doi.org/10.1088/0022-3735/22/9/022
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A high-performance scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1988
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982