Chaos and thermal noise in the rf-biased Josephson junction

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Abstract
The effect of thermal noise on chaotic behavior in the rf-biased Josephson junction is studied through digital simulations. In instances for which chaotic behavior occurs in the noise-free system, it is found that the dynamics of the system are almost unchanged by the addition of thermal noise unless the level of thermal noise exceeds that of the chaotic state. In instances for which the only stable states of the noise-free system are periodic solutions, small amounts of thermal noise can induce the junction to hop between two different dynamical states, producing a low-frequency noise level much higher than that of the thermal noise. Such noise-induced hopping can occur either between two periodic solutions or between a periodic solution and a metastable chaotic solution. When a metastable chaotic state is involved, temperatures somewhat higher than those which produce hopping can destablize the periodic solution to the point where the system spends virtually all of its time in the metastable chaotic state, creating noise-induced chaos. The similarities between chaotic behavior at zero temperature and noise-induced chaos are sufficiently strong that it may be difficult to distinguish the two cases experimentally.