Nanometer-scale recording on chalcogenide films with an atomic force microscope

• 29 May 1995
• journal article
• Published by AIP Publishing in Applied Physics Letters
• Vol. 66  (22) , 2961-2962
• https://doi.org/10.1063/1.114243

Abstract

Keywords

• ATOMIC FORCE MICROSCOPE
• SURFACE TOPOGRAPHY
• ATOMIC FORCE MICROSCOPY
• DATA STORAGE