Imaging of thermal properties and topography by combined scanning thermal and scanning tunneling microscopy
- 12 February 1996
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 31 (1-4) , 241-248
- https://doi.org/10.1016/0167-9317(95)00347-9
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Thermal imaging using the atomic force microscopeApplied Physics Letters, 1993
- Scanning probe microscopy of thermal conductivity and subsurface propertiesApplied Physics Letters, 1992
- Scanning thermal profilerApplied Physics Letters, 1986
- Photoacoustic, photothermal, and related techniques: a reviewCanadian Journal of Physics, 1986