Free drop test simulation for portable IC package by implicit transient dynamics FEM

Publisher Website

28 September 2004

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/ectc.2004.1319471

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Drop impact test - mechanics & physics of failure
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003