Application of the Eyring Model to Capacitor Aging Data
- 1 March 1965
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Component Parts
- Vol. 12 (1) , 34-41
- https://doi.org/10.1109/tcp.1965.1135088
Abstract
The Eyring Model has been used to derive the "power rule" for capacitors. Analytical models for evaluating progressive and step stress tests are presented. Various methods are discussed for determining the value of the exponent for the power rule. In particular, the relation between the exponent of the power rule and the \beta of the Weibull distribution, for both progressive and constant stress tests, is discussed. Data for mica capacitors are used to demonstrate the validity of these relations and to illustrate methods for determining the constants of the equations.Keywords
This publication has 4 references indexed in Scilit:
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- Gassing of Liquid Dielectrics under Electrical StressIndustrial & Engineering Chemistry, 1955
- Paper Capacitors Containing Chlorinated lmpregnants - Stabilization by AnthraquinoneIndustrial & Engineering Chemistry, 1945
- Effects of Time and Frequency on Insulation Test of TransformersTransactions of the American Institute of Electrical Engineers, 1924