Structural parameter determination in fluorescence EXAFS of concentrated samples
- 1 June 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (6) , 1021-1025
- https://doi.org/10.1063/1.1140311
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- On experimental attenuation factors of the amplitude of the EXAFS oscillations in absorption, reflectivity and luminescence measurementsJournal de Physique, 1982
- Extended x-ray absorption fine structure—its strengths and limitations as a structural toolReviews of Modern Physics, 1981
- Thickness effect on the extended-x-ray-absorption-fine-structure amplitudePhysical Review B, 1981
- Local-Structure Determination at High Dilution: Internal Oxidation of 75-ppm Fe in CuPhysical Review Letters, 1979
- X-ray filter assembly for fluorescence measurements of x-ray absorption fine structureReview of Scientific Instruments, 1979