Proximal probe-based fabrication of nanostructures

• 1 November 1996
• journal article
• Published by IOP Publishing in Semiconductor Science and Technology
• Vol. 11  (11S) , 1558-1562
• https://doi.org/10.1088/0268-1242/11/11s/018

Abstract

Keywords

• FIELD EFFECT TRANSISTOR
• ATOMIC FORCE MICROSCOPE
• ELECTRIC FIELD