STM investigation of energetic carbon cluster ion penetration depth into HOPG
- 1 May 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 112 (1-4) , 105-108
- https://doi.org/10.1016/0168-583x(95)01015-7
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Tandem time-of-flight mass spectrometer for cluster–surface scattering experimentsReview of Scientific Instruments, 1995
- Tracks in Metals by MeV FullerenesPhysical Review Letters, 1995
- Scanning tunneling microscopy investigation of graphite surface damage induced by gold-ion bombardmentJournal of Applied Physics, 1994
- Kinetics of surface roughening via pit growth during the oxidation of the basal plane of graphite. II. Theory and simulationThe Journal of Chemical Physics, 1993
- Reactions of NO, O2, H2O, and CO2 with the basal plane of graphiteSurface Science, 1992
- Effects of ion mass and energy on the damage induced by an ion beam on graphite surfaces: a scanning tunneling microscopy studySurface Science, 1992
- Scanning tunneling microscopy studies of carbon-oxygen reactions on highly oriented pyrolytic graphiteJournal of the American Chemical Society, 1991
- Scanning tunneling microscopy of defects induced by carbon bombardment on graphite surfacesSurface Science, 1990
- Effects of isolated atomic collision cascades on/Si interfaces studied by scanning tunneling microscopyPhysical Review B, 1988
- Configuration of interstitial atoms in irradiated graphiteSolid State Communications, 1966