Detection of sharp absorption lines in thin NdF_3 films
- 1 May 1991
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America B
- Vol. 8 (5) , 923-929
- https://doi.org/10.1364/josab.8.000923
Abstract
We report the use of a sensitive spectrometer system for studying sharp optical absorption lines that are due to transitions between 4ƒ3 crystal-field levels of Nd3+ in epitaxial NdF3 films. Films as thin as 50 Å on GaAs substrates displayed absorption lines with asymmetric line shapes. Samples with an antireflecting LaF3 buffer between the NdF3 layer and the substrate permitted observation of absorption lines in thinner films.Keywords
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