Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope
- 1 September 1990
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 29 (9R)
- https://doi.org/10.1143/jjap.29.1854
Abstract
An ion-implanted diamond tip sharpened to a radius of about 100 nm has sufficient conductivity for scanning tunneling microscopy. This tip can be used repeatedly even if it contacts the sample surface. Because the radius of the tip can be easily checked and does not show much wear from repeated usage, the relation of the tip radius to image resolution can be estimated.Keywords
This publication has 3 references indexed in Scilit:
- Local modification of organic dye materials by dielectric breakdownJournal of Vacuum Science & Technology A, 1990
- Direct measurement of forces during scanning tunneling microscope imaging of graphiteSurface Science, 1989
- Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribologyJournal of Vacuum Science & Technology A, 1988