Ionization and attachment in oxygen at low pressures
- 1 February 1969
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 2 (2) , 213-219
- https://doi.org/10.1088/0022-3727/2/2/310
Abstract
From measurements of pre-breakdown currents across plane-parallel electrodes, and with the aid of a simple analysis developed here, ionization and attachment coefficients have been evaluated for 50 < E/p0 < 250 v cm−1torr−1. Values of the attachment coefficient are found to reduce to practically zero at about 70 v cm−1 torr−1, which could indicate a detachment process. Sparking potentials were also measured in the range 01 < p0d < 5 cm torr, and this enabled the evaluation of generalized secondary coefficients.Keywords
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