Parafocusing Properties of Microcrystalline Powder Layers in X-Ray Diffraction Applied to the Design of X-Ray Goniometers
- 1 June 1946
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 17 (6) , 420-434
- https://doi.org/10.1063/1.1707733
Abstract
A distinction is drawn between the focusing properties of single crystals with regard to x‐ray diffraction and the parafocusing properties of microcrystalline powder layers. A discussion of these parafocusing properties and of the absorption term, which arises in the diffraction of x‐rays from powder layers, is followed by a discussion of various types of powder goniometers. Their characteristic properties are compared. The application of parafocusing conditions to the design of a goniometer for quantitative evaluations and of back reflection cameras is discussed in greater detail.This publication has 26 references indexed in Scilit:
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