The effects of ferroelectric capacitor testing methods on predicted imprint failure points
- 1 April 1997
- journal article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 16 (1-4) , 87-96
- https://doi.org/10.1080/10584589708013032
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The imprint mechanism in ferroelectric capacitorsIntegrated Ferroelectrics, 1995