XCVIII. The technique of precise electron-diffraction measurements with polycrystalline specimens

1 December 1945

journal article
research article
Published by Taylor & Francis in Journal of Computers in Education

Vol. 36 (263) , 821-835
https://doi.org/10.1080/14786444508521511

Abstract

Some factors affecting the size and shape of the electron-diffraction Tings obtained with transmission specimens are considered. The most important of these are the accumulation of electric charge on the photographic plate and the presence of weak stray magnetic fields.

Keywords

XCVIII
DIFFRACTION MEASUREMENTS
POLYCRYSTALLINE SPECIMENS
PRECISE ELECTRON
ELECTRON DIFFRACTION

This publication has 3 references indexed in Scilit:

LXIII. The precision of measurement of broad spectrum lines, with special reference to electron-diffraction photographs
Journal of Computers in Education, 1945
Recent Developments in the Electron Microscope
Proceedings of the IRE, 1941
Electron diffraction and surface structure
Transactions of the Faraday Society, 1935