The effect of specimen thickness on X-ray profiles in STEM
- 1 June 1981
- journal article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 43 (6) , 1587-1593
- https://doi.org/10.1080/01418618108239529
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On producing high-spatial-resolution composition profiles via scanning transmission electron microscopyPhilosophical Magazine A, 1981
- Grain boundary segregation of iron in polycrystalline magnesium oxide observed by STEMCeramurgia International, 1979
- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968