Wavefunctions of the divacancy in silicon
- 10 June 1981
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 14 (16) , 2217-2228
- https://doi.org/10.1088/0022-3719/14/16/005
Abstract
Hyperfine interaction data from ENDOR measurements on paramagnetic centres in silicon give important information of electron wavefunctions. A comparison is made between data on the positive and the negative charge states of the divacancy. For this comparison a phenomenological description is developed. The difference between wavefunctions of lattice defects like the divacancy, and coulombic centres like substitutional single and double donors leads to the supposition that in lattice defects electrons experience a potential which results from an extended lattice distortion. The data of the divacancy wavefunctions are related to other experimental observations on the divacancy. Correction terms to the dipole-dipole part of the hyperfine interaction of an LCAO scheme are elaborated. They can account qualitatively for experimental deviations from the simple LCAO model. Quantitatively, the corrections do not allow for further identifications of hyperfine interactions with next-nearest-neighbour lattice sites.Keywords
This publication has 24 references indexed in Scilit:
- Scattering-theoretic method for defects in semiconductors. II. Self-consistent formulation and application to the vacancy in siliconPhysical Review B, 1980
- Simple parametrized model for Jahn-Teller systems: Vacancy in-type siliconPhysical Review B, 1980
- New self-consistent approach to the electronic structure of localized defects in solidsPhysical Review B, 1979
- Magnetic Dipole–Dipole Hyperfine Integrals for Slater-Type OrbitalsPhysica Status Solidi (b), 1978
- Self-Consistent Green's-Function Calculation of the Ideal Si VacancyPhysical Review Letters, 1978
- Extended‐Hückel‐Theory Calculations for the Positive Divacancy in SiliconPhysica Status Solidi (b), 1978
- Scattering-theoretic method for defects in semiconductors. I. Tight-binding description of vacancies in Si, Ge, and GaAsPhysical Review B, 1978
- Electron-irradiation-induced divacancy in lightly doped siliconJournal of Applied Physics, 1976
- Electron-Paramagnetic-Resonance Detection of Optically Induced Divacancy Alignment in SiliconPhysical Review B, 1972
- Electron Spin Resonance Experiments on Donors in Silicon. I. Electronic Structure of Donors by the Electron Nuclear Double Resonance TechniquePhysical Review B, 1959