Empirical equations for predicting resistivity changes with fluence for electron-irradiated silicon
- 16 January 1980
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 57 (1) , K11-K15
- https://doi.org/10.1002/pssa.2210570156
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Complex defects introduced into Si by high-energy electron irradiation: Production rates of defects in n-SiJournal of Applied Physics, 1977
- Electrical properties of electron-irradiated n-type siliconJournal of Applied Physics, 1976
- Introduction Rates of Electrically Active Defects in n- and p-Type Silicon by Electron and Neutron IrradiationJournal of Applied Physics, 1968
- Design curves for predicting fast-neutron-induced resistivity changes in siliconProceedings of the IEEE, 1968