Concentration profiles through thin oxide scales by ion-probe microanalysis
- 1 February 1973
- journal article
- research article
- Published by Springer Nature in Metallurgical Transactions
- Vol. 4 (2) , 411-417
- https://doi.org/10.1007/bf02648692
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The high-temperature oxidation of nickel-20 wt. % chromium alloys containing dispersed oxide phasesOxidation of Metals, 1972
- Impurity Distributions in Anodic Films on TantalumJournal of the Electrochemical Society, 1972
- The oxidation of TD NiC (Ni-20Cr-2 vol pct ThO2) between 900° and 1200°CMetallurgical Transactions, 1971