Transmission electron microscopy studies of growth and interface structure of chemically vapour deposited TiC and TiN films on WCCo alloy subsrates
- 20 March 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 198 (1-2) , 293-300
- https://doi.org/10.1016/0040-6090(91)90347-z
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Defect structure of ion-plated titanium nitride coatingsThin Solid Films, 1989
- Growth and Interface Structure of TiC and TiN Films Deposited on WC-Co AlloysJournal of the Japan Institute of Metals and Materials, 1988
- Diffusion of cobalt into a TiC layer during chemical vapour deposition and its effects on the cutting performance of TiC/Al2O3-coated cemented carbidesThin Solid Films, 1985
- Influence of apparatus geometry and deposition conditions on the structure and topography of thick sputtered coatingsJournal of Vacuum Science and Technology, 1974