Surface analysis of metallized poly(bisphenol A carbonate) films by X-ray absorption spectroscopy (NEXAFS)
- 1 July 1996
- Vol. 37 (14) , 3157-3160
- https://doi.org/10.1016/0032-3861(96)89419-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Surface analysis of partially crystalline and amorphous poly(ethylene terephthalate) samples by X-ray absorption spectroscopy (NEXAFS)Polymer, 1996
- XPS/AFM study of thermally evaporated aluminium/polycarbonate interfaceSurface and Interface Analysis, 1994
- Valence band region XPS, AFM and NEXAFS surface analysis of low pressure d.c. oxygen plasma treated polypropylenePolymer, 1994
- Carbon 1snear-edge-absorption fine structure in graphitePhysical Review B, 1993
- Reactions of metal atoms with poly(methylphenylsiloxanes) and other polymers and compounds of low volatilityJ. Chem. Soc., Dalton Trans., 1980
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979