Recent Advances in X-Ray Detection Technology
- 1 June 1968
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 15 (3) , 10-46
- https://doi.org/10.1109/tns.1968.4324913
Abstract
A review is presented of recent developments in x-ray photon detectors and in the associated detector electronics. The first portion of the paper is devoted to a survey of the presently available physical inforrnation on the "intrinsic" resolution of silicon and germanium radiation detectors, proportional counters and NaI(Tl) scintillation crystals. Semiconductor detectors suitable for x-ray applications and low noise electronics are then analyzed in some detail. Discussions follow on scintillation detectors, proportional counters, and "external" photoelectric detectors. Recent spectral achievements and interesting applications are illustrated.Keywords
This publication has 80 references indexed in Scilit:
- Proportional counter resolutionNuclear Instruments and Methods, 1968
- Accurate determination of the ionization energy in semiconductor detectorsNuclear Instruments and Methods, 1968
- Balloon X-ray astronomy.AIAA Journal, 1967
- 500-volt resolution with a Si(Li) detector using a cooled FET preamplifierNuclear Instruments and Methods, 1967
- Carrier multiplication in semiconductor detectorsNuclear Instruments and Methods, 1967
- The Influence of Cathode Thickness and Aging on the Photoelectric Yields of LiF and CsI in the xuvApplied Optics, 1966
- Measurements of the Fano factor and the energy per hole-electron pair in germaniumNuclear Instruments and Methods, 1966
- Peak/total-ratios for NaI(Tl)-crystalsNuclear Instruments and Methods, 1966
- A hybrid preamplifier for cooled lithium ion-drifted semiconductor detectorsNuclear Instruments and Methods, 1965
- CaI2 and CaI2(Eu) Scintillation CrystalsReview of Scientific Instruments, 1964