Magnetic properties of compositionally modulated Co/Mn thin films

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Abstract
Magnetic properties of multilayered Co/Mn films with layer thickness ranging from 7–70 Å have been studied. The films were prepared by alternately depositing Co and Mn layers in an ultrahigh vacuum (UHV) evaporator. X‐ray θ‐2θ scans with Cu‐Kα radiation showed a main diffraction peak around 2θ=44° for all films and satellite peaks for some of them. The data imply the existence of α‐Co (002)/α‐Mn (330) stacking texture.Ferromagnetic resonance (FMR) study and vibrating‐sample magnetometer (VSM) measurement show that the magnetization of Co layers decreases with decreasing Co thickness as if 1.5 atomic layers lost their magnetic moments at the interface. FMR spectra of the films show a peculiar temperature dependence in that the perpendicular resonance field starts to decrease below a certain temperature. The results are discussed.