Techniques for the diagnosis of switching circuit failures
- 1 January 1961
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 152-160
- https://doi.org/10.1109/focs.1961.33
Abstract
In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred. For any single-output combinational circuit, with no more than 35 input variables, the program computes the set of all inputs detecting a given failure - the essential novelty of the method. These sets, one for each failure, are then Processed to find a (small) subset of tests which detect any failure. The underlying method extends to the diagnosis of circuits with feedback.Keywords
This publication has 1 reference indexed in Scilit:
- Algebraic Topological Methods for the Synthesis of Switching Systems—Part III: Minimization of Nonsingular Boolean TreesIBM Journal of Research and Development, 1959