Pseudo depth profiling by ESCA and X-ray microanalysis: An application to chemical dealumination of Y-zeolites
- 1 May 1989
- Vol. 9 (3) , 250-252
- https://doi.org/10.1016/0144-2449(89)90034-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Faujasites dealuminated with ammonium hexafluorosilicate: Variables affecting the method of preparationZeolites, 1988
- Influence of framework aluminum gradients on the catalytic activity of Y zeolites: Cracking of gas-oil on Y zeolites dealuminated by different proceduresJournal of Catalysis, 1987
- The effect of acid treatment on the properties of dealuminated Y zeoliteJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1986
- Minimum depth electron probe x‐ray microanalysis as a means for determining the sulphur content of the human hair surfaceScanning, 1979