Ultrastructural Cytology of Soybean Infected with Mild and Severe Strains of Soybean Mosaic Virus

Publisher Website
Google Scholar
Abstract
Two soybean mosaic virus (SMV) strains from Virginia, VA/G1 and OCM/G3, and 2 SMV strains from Illinois, IL/G1 and IL/G3, were compared biologically and ultrastructurally in soybean (G. max ''Essex''). Strain VA/G1 induced severe mosaic symptoms on soybean and abundant pinwheel inclusions in the cytoplasm of infected cells. Strains OCM/G3, IL/G3, and IL/G1 induced extremely mild symptoms with both pinwheels and cytoplasmic strands. Cytoplasmic strands contained virus particles and traversed the vacuole of infected cells. The 4 strains were closely related in serological tests. In a time-sequence study, pinwheels were detected in leaves infected with all of the strains 9 days after inoculation. Cytoplasmic strands were first observed at 10 days in cells infected with strain OCM/G3 or IL/G3 and at 11 days with IL/G1. No cytoplasmic strands were observed in cells infected with the severe strain, VA/G1. Production of cytoplasmic strands was probably an intracellular virus localization mechanism leading to the tolerant reaction of ''Essex'' soybean to the 3 mild strains of SMV.

This publication has 1 reference indexed in Scilit: