In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
- 24 October 2006
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 21585601,p. 63-64
- https://doi.org/10.1109/vlsic.2006.1705313
Abstract
An in-situ measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supplyKeywords
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