Diffracted-Beam Monochromatization Techniques in X-Ray Diffractometry

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Abstract
Four techniques using curved‐crystal focusing monochromators are described: combinations of a reflection specimen and reflection monochromator, a reflection specimen and transmission monochromator, a transmission specimen and reflection monochromator, and a transmission specimen and transmission monochromator. The first technique allows recording of diffraction patterns due to Kα1 radiation only, and elimination of Compton‐scattered radiation (except at low angles). The second technique provides a back‐reflection diffractometer for measurements at Bragg angles up to 90°. The third technique can be applied to weakly absorbing specimens when a strictly monochromatic diffraction pattern is required. Various aspects of the focusing geometry are analyzed.