LARGE SCALE MAGNETIC FIELD MEASUREMENTS AND MAPPING

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Abstract
The paper illustrates the most recent techniques in the field of large-scale magnetic measurements. The main problems related to field mapping are discussed. The development of microelectronics during the last few years has created a revolution in magnetic measurement systems. Modular hardware and software as well as widely used industrial standards have influenced the architecture of measurement systems. The use of embedded microprocessors in the equipment and the application of modern algorithms have improved the performance of measurement probes and simplified their calibration. A modern system also provides facilites for on-line analysis and display of measurement results as well as early detection and indication of equipment faults

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