Sample thickness dependence of the exciton polariton absorption coefficient in Cu2O
- 20 January 1980
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 13 (2) , 267-275
- https://doi.org/10.1088/0022-3719/13/2/014
Abstract
The sample thickness dependence of the absorption coefficient of the yellow exciton 1s line of Cu2O was investigated experimentally using present state of the art crystals. The integrated absorption coefficient increases as the sample thickness decreases and also has an oscillatory component with period 0.053 cm. The experimental results are discussed in terms of the exciton-polariton formalism described by Pekar (1958) and Hopfield (1963).Keywords
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