Säulenwchstum bei aufgedampften schichten
- 1 December 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 167 (1-2) , 281-290
- https://doi.org/10.1016/0040-6090(88)90505-6
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Nodular defects in dielectric multilayers and thick single layersApplied Optics, 1981
- Columnar microstructure in vapor-deposited thin filmsThin Solid Films, 1977
- Computer simulation of amorphous thin films of hard spheresThin Solid Films, 1977
- Effect of vapour incidence angles on profile and properties of condensed filmsThin Solid Films, 1972
- Correlation between film structure and sorption behaviour of vapour deposited ZnS, cryolite and MgF2 filmsThin Solid Films, 1972