Effects of dangling bond charge on ambipolar transport measurements in a-Si:H
- 1 January 1991
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 137-138, 475-478
- https://doi.org/10.1016/s0022-3093(05)80158-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Steady-state photocarrier grating technique for diffusion-length measurement in semiconductors: Theory and experimental results for amorphous silicon and semi-insulating GaAsJournal of Applied Physics, 1987
- Dynamics of Staebler-Wronski effect in hydrogenated amorphous siliconJournal of Non-Crystalline Solids, 1987
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