XPS‐investigation of titanium modified MFI‐type zeolites
- 1 July 1994
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 22 (1-12) , 403-406
- https://doi.org/10.1002/sia.740220187
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Raman‐Spectroscopic Evidence for Four‐Fold Coordinated Titanium in Silicalite IBerichte der Bunsengesellschaft für physikalische Chemie, 1993
- XPS and XAES study of titania-silica mixed oxide systemThe Journal of Physical Chemistry, 1993
- Framework composition of titanium silicalite-1Journal of Catalysis, 1992
- Novel titanium sites in silicalitesCatalysis Letters, 1992
- A XANES and EXAFS investigation of titanium silicaliteJournal of the Chemical Society, Chemical Communications, 1991
- Surface studies of TiO2SiO2 glasses by X-ray photoelectron spectroscopyJournal of Non-Crystalline Solids, 1990
- XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energiesSurface and Interface Analysis, 1984
- Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eVJournal of Electron Spectroscopy and Related Phenomena, 1976