Visualization of the depleted layer in nanoscaled pn junctions on Si(001) surfaces with the use of scanning tunneling microscopy
- 1 April 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 144-145, 554-563
- https://doi.org/10.1016/s0169-4332(98)00865-4
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Scanning tunneling microscopy study of the hydrogen-terminated n- and p-type Si(001) surfacesApplied Surface Science, 1998
- Two-dimensional pn-junction delineation and individual dopant identification using scanning tunneling microscopy/spectroscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1998
- Ideal hydrogen termination of Si(001) surface by wet-chemical preparationApplied Physics Letters, 1995
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983