Interferometry of strongly refracting axisymmetric phase objects
- 1 July 1975
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 14 (7) , 1601-1606
- https://doi.org/10.1364/ao.14.001601
Abstract
Inversion of measurements of optical pathlength through strongly refracting, radially symmetric phase objects, such as plasmas, is discussed. An exact inversion scheme, based upon methods originally applied in seismology is developed and applied to interferometry. It is shown that Abel inversion, which assumes that the probing rays are straight lines, yields rather accurate results if the interferogram is formed with appropriate imaging.Keywords
This publication has 9 references indexed in Scilit:
- Holographic interferometry of exploding wiresJournal of Applied Physics, 1973
- The determination of plasma electron density from refraction measurementsPlasma Physics, 1973
- An infrared Schlieren interferometer for measuring electron density profilesPlasma Physics, 1972
- Two-Wavelength Holographic Interferometry of Partially Ionized PlasmasPhysics of Fluids, 1970
- On the radio occultation method for studying planetary atmospheresJournal of Geophysical Research, 1968
- Optical Interferometry of Inhomogeneous GasesJournal of the Optical Society of America, 1966
- Solution of an Abel Integral Equation for Band-Limited Functions by Means of Sampling TheoremsJournal of Mathematics and Physics, 1964
- Method for Computing the Radial Distribution of Emitters in a Cylindrical Source*Journal of the Optical Society of America, 1962
- Transformation of Observed Radiances into Radial Distribution of the Emission of a Plasma*Journal of the Optical Society of America, 1961