Mesoplasma breakdown in silicon junctions

• 1 March 1963
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 51  (3) , 500-501
• https://doi.org/10.1109/proc.1963.1890

Abstract

Keywords

• ELECTRIC BREAKDOWN
• SILICON
• PLASMA TEMPERATURE
• P-N JUNCTIONS
• LIGHT EMITTING DIODES
• BREAKDOWN VOLTAGE
• PLASMA PROPERTIES
• CIRCUITS
• DELAY EFFECTS
• SWITCHES