Determination of depletion width in amorphous materials using a simple analytical model
- 30 June 1980
- journal article
- Published by Elsevier in Solar Energy Materials
- Vol. 2 (3) , 349-361
- https://doi.org/10.1016/0165-1633(80)90011-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A new amorphous silicon-based alloy for electronic applicationsNature, 1978
- Electronic properties of substitutionally doped amorphous Si and GePhilosophical Magazine, 1976
- Capacitance Energy Level Spectroscopy of Deep-Lying Semiconductor Impurities Using Schottky BarriersJournal of Applied Physics, 1970