Calibration Techniques for X-Ray Fluorescence Analysis of Thin Nickel-Chromium Films.

• 1 February 1966
• journal article
• Published by American Chemical Society (ACS) in Analytical Chemistry
• Vol. 38  (2) , 200-203
• https://doi.org/10.1021/ac60234a013

Abstract

Keywords

• CHROMIUM
• NICKEL