Abstract
A method is described for the quantitative analysis of bulk specimens without standards by using peak‐to‐local background ratios in energy‐dispersive electron probe microanalysis. Theoretical transport investigations have been used to derive an expression for the absolute determination of (P/B) ratios. Accurate measurement of the background below a peak is carried out without an exact knowledge of the surface geometry of the specimens. The advantages of this method are discussed in comparison with other correction procedures and the efficiency is demonstrated by means of quantitative analysis of nine binary specimens and two steel specimens.