Vector field analysis for oriented patterns
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 673-676
- https://doi.org/10.1109/cvpr.1992.223204
Abstract
A method based on the properties of orientation fields is presented for the estimation of a set of symbolic descriptors from nondegenerate linear orientation fields, modeled by two-dimensional first-order phase portraits. It was previously shown that flow orientation is sufficient to characterize a flow pattern and locate its critical point position. A linear estimator is designed to estimate nondegenerate phase portraits. A classification scheme based on their local properties-curl, divergence, and deformation-is developed. Some experimental results are reported Author(s) Chiao-Fe Shu Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA Jain, R.C.Keywords
This publication has 10 references indexed in Scilit:
- Computing oriented texture fieldsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Vector field analysis for oriented patternsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A linear algorithm for computing the phase portraits of oriented texturesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Analyzing oriented textures through phase portraitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Interactive analysis of the topology of 4D vector fieldsIBM Journal of Research and Development, 1991
- A Taxonomy for Texture Description and IdentificationPublished by Springer Nature ,1990
- Representation and display of vector field topology in fluid flow data setsComputer, 1989
- Analyzing oriented patternsComputer Vision, Graphics, and Image Processing, 1987
- Topology of Three-Dimensional Separated FlowsAnnual Review of Fluid Mechanics, 1982
- Invariant Properties of the Motion Parallax Field Due to the Movement of Rigid Bodies Relative to an ObserverOptica Acta: International Journal of Optics, 1975