The (pX, X) experiment — A new approach for partial sensitivity enhancement in trace element analysis
- 1 May 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 151 (3) , 439-444
- https://doi.org/10.1016/0029-554x(78)90153-2
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Proton-induced X-ray emission analysis of thick and thin targetsNuclear Instruments and Methods, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Proton-induced X-ray analysis of steel surfaces for microprobe purposesNuclear Instruments and Methods, 1975
- Detection of proton-induced boron X-rays with a Si(Li) detectorNuclear Instruments and Methods, 1974