Interferometric measurements of very small electrostrictive strains
- 1 January 1983
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 54 (1) , 90-92
- https://doi.org/10.1063/1.1137230
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Noise limitations of Michelson laser interferometersJournal of Physics D: Applied Physics, 1980
- Quadratic electrostrictive effects in LiF, NaF, NaBr, KCl, KBr, KI, RbCl, RbBr and RbIActa Crystallographica Section A, 1977
- Relation between Photoelasticity, Electrostriction, and First-Order Raman Effect in Crystals of the Diamond StructurePhysical Review B, 1967