Determination of semiconductor surface parameters from electroreflectance studies
- 1 November 1967
- journal article
- Published by Elsevier in Surface Science
- Vol. 8 (4) , 399-416
- https://doi.org/10.1016/0039-6028(67)90047-7
Abstract
No abstract availableThis publication has 32 references indexed in Scilit:
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