Measurement of the detection quantum efficiency of microchannel plates for medium energy electrons
- 1 February 1987
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 20 (2) , 177-181
- https://doi.org/10.1088/0022-3735/20/2/011
Abstract
The detection quantum efficiency (DQE) of microchannel plates for electrons in the energy range from 5 to 50 keV was measured with enough spatial resolution to resolve the single channels using a scanning electron microscope. Between 10 and 50 keV the DQE is found to decrease with increasing energy from 0.4 to 0.2. Microchannel plates for image intensification in electron microscopy have been found inferior to photographic recording and well designed image pickup devises using phosphor screens on fibre plates. Nevertheless their DQE is sufficient for observing low intensity electron images at a high brightness level if some additional noise can be tolerated.Keywords
This publication has 5 references indexed in Scilit:
- The electron detection efficiency of microchannel platesNuclear Instruments and Methods in Physics Research, 1983
- Secondary Electron Emission and Compositional Studies on Channel Plate Glass SurfacesPublished by Elsevier ,1976
- Signal to Noise and Collection Efficiency Measurements in MicroChannel Wafer Image IntensifiesPublished by Elsevier ,1976
- A statistical model for photomultiplier single-electron statisticsNuclear Instruments and Methods, 1966
- Quantum Efficiency of Human VisionJournal of the Optical Society of America, 1959