FT-IR as a Tool for the Characterization of Industrial Materials

Publisher Website

1 January 1987

book chapter
Published by Springer Nature

p. 341-362
https://doi.org/10.1007/978-1-4684-7776-4_17

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

Application of Fourier Transform Infrared Emission Spectrometry to Surface Analysis
Applied Spectroscopy, 1984
Fourier transform infrared reflection absorption spectrometry and electron spectroscopy for chemical analysis for surface analysis
Analytical Chemistry, 1982
X-ray photoelectron spectra and Fourier transform infrared spectra of mono- and multilayer films of cadmium arachidate
The Journal of Physical Chemistry, 1978
A totally synthetic bilayer membrane
Journal of the American Chemical Society, 1977