The Influence of Crystallographic Defects on Device Performance

• 1 January 1966
• journal article
• Published by The Electrochemical Society in Journal of the Electrochemical Society
• Vol. 113  (11) , 1229-1231
• https://doi.org/10.1149/1.2423791

Abstract

Keywords

• SEMICONDUCTOR DIODES
• CRYSTAL DEFECTS
• ELECTRIC PROPERTIES
• LEAKAGE CURRENTS
• SILICON
• SEMICONDUCTOR DEVICE RELIABILITY