The real space method for dynamical electron diffraction calculations in high resolution electron microscopy: II. Critical analysis of the dependency on the input parameters
- 31 December 1984
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 15 (1-2) , 41-50
- https://doi.org/10.1016/0304-3991(84)90073-1
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- The real space method for dynamical electron diffraction calculations in high resolution electron microscopy: I. Principles of the methodUltramicroscopy, 1984
- Real space image simulation in high resolution electron microscopyUltramicroscopy, 1983
- High‐speed computation techniques for the simulation of high resolution electron micrographsJournal of Microscopy, 1983
- Practical computation of amplitudes and phases in electron diffractionUltramicroscopy, 1983
- Fast computational procedures for the simulation of structure images in complex or disordered crystals: a new approachJournal of Microscopy, 1980
- A new theoretical and practical approach to the multislice methodActa Crystallographica Section A, 1977
- Numerical evaluations ofN-beam wave functions in electron scattering by the multi-slice methodActa Crystallographica Section A, 1974
- An alternative method for the calculation of a phase-grating function for use in dynamic electron-diffraction calculationsActa Crystallographica Section A, 1974
- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968
- The scattering of electrons by atoms and crystals. I. A new theoretical approachActa Crystallographica, 1957