A swept two-frequency microwave reflectometer for edge density profile measurements on TFTR
- 1 October 1992
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (10) , 4658-4660
- https://doi.org/10.1063/1.1143654
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- X-mode broadband reflectometric density profile measurements on DIII-DReview of Scientific Instruments, 1990